Intel announced the very first Cryogenic Wafer Prober, that is used to validate and test qubits used for quantum computing. The wafer prober is a first of its kind tool that could potentially revolutionize the testing and information collection process of qubits.
Reported first by Business Wire, the tool is specifically designed to speed up the development of quantum computing solutions. Researchers can use the tool to test qubits on 300mm wafers at temperatures of a few kelvins.
Dr. Jim Clarke, director of Quantum Hardware at Intel states, “Building on our expertise in transistor process technology, we saw the need to create a 300mm high-volume fabrication and test line for semiconductor spin qubits.”
Data collection and access are the biggest challenges quantum computing faces today. At present, each new quantum processor undergoes months of testing in dilution refrigerators to ascertain what works and what doesn’t.
The tool was built in collaboration with Bluefors and Afore, leaders in cryogen-free dilution refrigerator systems and micro-electro-mechanical systems, respectively. Intel has worked with the two pioneers to build a fast electrical characterization tool that operates in the quantum domain.
Time-saving benefits offered by the tool are its most desired advantages. Collection of data such as quantum noise, spin qubits and quantum dot quality that took weeks, can now be done in a matter of minutes.
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The first Cryogenic Wafer Prober will be set up at Intel’s Oregon Campus and will be used to speed up research and development of various quantum technologies.